DocumentCode :
2379287
Title :
Open ATE architecture: key challenges
Author :
West, Burnell G.
Author_Institution :
NPTest, San Jose, CA, USA
fYear :
2002
fDate :
2002
Firstpage :
1212
Abstract :
The drive to reduce overall cost of test has a long history. However, the possibility to reduce this overall cost of test by developing an open ATE architecture has only recently begun to be explored in much detail. It seems clear that opening up ATE system architecture to participation by a collection of suppliers is now feasible. Open architecture standards for test systems must embody several key features, the most challenging of these being fixturing, synchronization, software, data volume, power delivery, and system integration and verification.
Keywords :
automatic test equipment; automatic test software; formal verification; integrated circuit testing; open systems; synchronisation; IC test; automatic test equipment; fixturing; open ATE architecture key challenges; power delivery; synchronization; system integration/verification; test cost reduction; test data volume; test system software; Certification; Computer architecture; Cooling; Costs; Fixtures; Instruments; Packaging; Software packages; Software tools; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2002. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-7542-4
Type :
conf
DOI :
10.1109/TEST.2002.1041917
Filename :
1041917
Link To Document :
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