DocumentCode
2379429
Title
Test and repair of non-volatile commodity and embedded memories
Author
Tsuchida, Shigeo
fYear
2002
fDate
2002
Firstpage
1223
Abstract
Summary form only given. Semiconductor memory market has been driven by DRAM. However non-volatile memory market, flash memory as a representative, is growing remarkably because of its versatile application market such as cellular phone, PC memory card, silicon audio, digital still camera storage, automobile application with MCU and so forth. In terms of testing, it is quite different from DRAM. The author describes the differences, requirements and solutions for flash memory repair and testing from the viewpoint of ATE.
Keywords
automatic testing; flash memories; integrated circuit testing; integrated memory circuits; logic testing; ATE; NAND/AND device; embedded flash memory; flash memory repair; flash memory testing; nonvolatile memory; semiconductor memory; Cellular phones; Cost function; Flash memory; Logic devices; Logic testing; Nonvolatile memory; Random access memory; Semiconductor memory; Silicon; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041926
Filename
1041926
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