DocumentCode :
2379740
Title :
Transient photo-induced absorption in InGaN thin films
Author :
Nomura, M.-S. ; Arita, M. ; Ashihara, S. ; Kako, S. ; Arakawa, Y. ; Shimura, T. ; Kuroda, K.
Author_Institution :
Inst. of Ind. Sci., Tokyo Univ., Japan
Volume :
1
fYear :
2003
fDate :
27-28 Oct. 2003
Firstpage :
256
Abstract :
Structure dependent absorption spectrum changes In0.10Ga0.90 thin films of different thickness (5.5, 17, 34, and 66 nm) are investigated by nondegenerate femtosecond pump and probe spectroscopy at room temperature. These spectrum changes are caused by excitonic absorption quenching and screening of internal piezoelectric fields by photo-induced carriers. Both fast (500 ps) and slow (100 μs) temporal behaviors are observed in differential absorption spectra. Localized carriers in indium-rich regions and/or carriers captured in midgap traps are considered to keep screening the internal filed and to maintain absorption spectrum changes much longer than the photoluminescence lifetimes.
Keywords :
II-VI semiconductors; high-speed optical techniques; indium compounds; photoluminescence; radiation quenching; radiative lifetimes; semiconductor thin films; time resolved spectra; 100 mus; 20 degC; 500 ps; In0.10Ga0.90; InGaN thin films; absorption spectrum; differential absorption spectra; excitonic absorption quenching; excitonic absorption screening; internal piezoelectric fields; localized carriers; nondegenerate femtosecond spectroscopy; photoinduced carriers; photoluminescence lifetimes; pump and probe spectroscopy; room temperature; transient photoinduced absorption; Absorption; Electron traps; Photoluminescence; Probes; Pulse amplifiers; Radiative recombination; Spectroscopy; Spontaneous emission; Transistors; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
ISSN :
1092-8081
Print_ISBN :
0-7803-7888-1
Type :
conf
DOI :
10.1109/LEOS.2003.1251734
Filename :
1251734
Link To Document :
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