DocumentCode
238239
Title
Accuracy enhancement of material characterization in sub-THz range
Author
Piasecki, Przemyslaw ; Godziszewski, K. ; Yashchyshyn, Y.
Author_Institution
Inst. of Radioelectron., Warsaw Univ. of Technol., Warsaw, Poland
fYear
2014
fDate
16-18 June 2014
Firstpage
1
Lastpage
4
Abstract
In this paper many aspects of material characterization in sub-THz frequency range are shown. Methods of reducing unwanted reflections from construction of the measurement setup and from the sample under test are proposed. The influence of lens tilt on electromagnetic field distribution in location of the sample is investigated.
Keywords
lenses; submillimetre wave measurement; terahertz materials; electromagnetic field distribution; lens tilt influence; sample under test; subTHz material range; unwanted reflections reduction; Antenna measurements; Electric fields; Frequency measurement; Lenses; Materials; Permittivity measurement; Reflection; Sub-THz; measurement accuracy; permittivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves, Radar, and Wireless Communication (MIKON), 2014 20th International Conference on
Conference_Location
Gdansk
Print_ISBN
978-617-607-553-0
Type
conf
DOI
10.1109/MIKON.2014.6900001
Filename
6900001
Link To Document