DocumentCode :
2382492
Title :
A method of diode parallel to improve the reliability of the thermoelectric coolers
Author :
Zhang Jianzhong ; Chen Song
Author_Institution :
Tianjin Inst. of Power Sources
fYear :
1997
fDate :
26-29 Aug 1997
Firstpage :
690
Lastpage :
692
Abstract :
Thermoelectric coolers (TECs) are very reliable solid-state devices which do not make any noise or give off harmful fluids/gases. With the increasing use of TECs, research on their reliability is required. This paper introduces the method for reliability design, which is in parallel with diode. A thermoelectric cooling module consists of some couples of thermoelements, connected in series by copper tabs. If a solder joint breaks, the thermoelectric cooling module fails. So redundancy can be used. The thermoelements are divided into some groups, and every group is parallel with a diode. If a thermoelement fails, the parallel diode conducts, so the thermoelectric cooling module continues operating. Thus, the reliability is greatly improved. As a result of calculation and series experiments, the failure rate of thermoelectric cooling module decrease by 40%, the electric current reduces by 4% and the cooling power is cut down by 4%. The negative function is not obvious
Keywords :
cooling; heat pumps; heat sinks; modules; redundancy; reliability; thermoelectric devices; Peltier effect heat pump; connected in series; couples of thermoelements; failure rate; heat sinks; parallel diode; redundancy; reliability improvement; thermoelectric coolers; Cooling; Copper; Design methodology; Diodes; Gases; Redundancy; Soldering; Solid state circuits; Thermoelectric devices; Thermoelectricity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 1997. Proceedings ICT '97. XVI International Conference on
Conference_Location :
Dresden
ISSN :
1094-2734
Print_ISBN :
0-7803-4057-4
Type :
conf
DOI :
10.1109/ICT.1997.667624
Filename :
667624
Link To Document :
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