Ten-volt Josephson junction array voltage standard at ETL

Author

Murayama, Y. ; Sakuraba, T. ; Sakamoto, Y. ; Yoshida, H. ; Kozakai, T. ; Endo, T.

Author_Institution

Electrotech. Lab., Ibaraki, Japan

fYear

1996

fDate

17-21 June 1996

Firstpage

144

Lastpage

145

Abstract

A voltage standard system using a 10-V Josephson junction array has been developed. The uncertainty is 0.6/spl times/10/sup -8/ for measurement of the 10-V output Zener diode reference standard. A comparison of the 10-V array system with the conventional 10-V measurement system composed of a 1-V array and a voltage divider was performed through measurements of a 10-V output of a Zener. The result agreed within the uncertainty (/spl sim/1/spl times/10/sup -8/) of the comparison.

Keywords

Josephson effect; Zener diodes; aluminium compounds; calibration; critical current density (superconductivity); measurement standards; millimetre wave measurement; niobium; superconductor-insulator-superconductor devices; voltage measurement; 10 V; ETL; Josephson junction array; Nb-AlO-Nb; Zener diode reference standard; calibration; critical current density; mm-wave measurement; uncertainty; voltage standard; Circuits; Electrical resistance measurement; Filters; Frequency measurement; Josephson junctions; Millimeter wave measurements; Noise measurement; Pollution measurement; Relays; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1996 Conference on

Conference_Location

Braunschweig, Germany

Print_ISBN

0-7803-3376-4

Type

conf

DOI

10.1109/CPEM.1996.546660

Filename

546660