• DocumentCode
    2385157
  • Title

    Modeling and control of a new actuation mechanism for Interfacial Force Microscopy

  • Author

    Mesbah-Nejad, A. ; Moallem, M. ; Patel, R.V.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Western Ontario Univ., London, ON
  • fYear
    2008
  • fDate
    11-13 June 2008
  • Firstpage
    2052
  • Lastpage
    2057
  • Abstract
    In this paper, a new model for a capacitance- based force sensor used in interfacial force microscopy (IFM) is proposed. This model considers both rotation and bending of the torsion bars of a teeter-totter mechanism. A new actuation method is introduced which greatly reduces the stress and strain of the torsion bars. This results in increased sensitivity of the sensor. A dynamic output feedback controller for this actuation scheme is utilized in which the only measurement required is the position of the sensor. Simulation results are presented that confirm the analytical results.
  • Keywords
    bending; feedback; force sensors; microscopy; physical instrumentation control; rotation; actuation mechanism; bending; capacitance- based force sensor; dynamic output feedback controller; interfacial force microscopy; rotation; teeter-totter mechanism; torsion bars; Analytical models; Bars; Capacitance; Capacitive sensors; Force control; Force sensors; Microscopy; Output feedback; Position measurement; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2008
  • Conference_Location
    Seattle, WA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-2078-0
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2008.4586795
  • Filename
    4586795