DocumentCode
2385157
Title
Modeling and control of a new actuation mechanism for Interfacial Force Microscopy
Author
Mesbah-Nejad, A. ; Moallem, M. ; Patel, R.V.
Author_Institution
Dept. of Electr. & Comput. Eng., Western Ontario Univ., London, ON
fYear
2008
fDate
11-13 June 2008
Firstpage
2052
Lastpage
2057
Abstract
In this paper, a new model for a capacitance- based force sensor used in interfacial force microscopy (IFM) is proposed. This model considers both rotation and bending of the torsion bars of a teeter-totter mechanism. A new actuation method is introduced which greatly reduces the stress and strain of the torsion bars. This results in increased sensitivity of the sensor. A dynamic output feedback controller for this actuation scheme is utilized in which the only measurement required is the position of the sensor. Simulation results are presented that confirm the analytical results.
Keywords
bending; feedback; force sensors; microscopy; physical instrumentation control; rotation; actuation mechanism; bending; capacitance- based force sensor; dynamic output feedback controller; interfacial force microscopy; rotation; teeter-totter mechanism; torsion bars; Analytical models; Bars; Capacitance; Capacitive sensors; Force control; Force sensors; Microscopy; Output feedback; Position measurement; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2008
Conference_Location
Seattle, WA
ISSN
0743-1619
Print_ISBN
978-1-4244-2078-0
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2008.4586795
Filename
4586795
Link To Document