• DocumentCode
    2385995
  • Title

    Self-aligned printing of high-performance polymer thin-film transistors

  • Author

    Noh, Yong-Young ; Zhao, Ni ; Cheng, Xiaoyang ; Sirringhaus, Henning

  • Author_Institution
    Cavendish Lab., Cambridge Univ.
  • fYear
    2006
  • fDate
    11-13 Dec. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Self-aligned printing (SAP) is a recently developed bottom-up printing technique which utilizes the unique ink droplet motion on heterogeneous surfaces to define nanoscale critical features with high yield and uniformity. It was originally developed with conductive polymers. Here we extend this method to fabrication of functional conductive nanostructures with gold nanoparticle ink that allow achieving much higher conductivities. Channel lengths down to 60 nm were achieved by controlling the motion of the droplet contact line. The higher conductivity of gold results in significantly improved thin-film transistor (TFT) performance. We will discuss the device physics of these printed submicron organic transistors, provide an update on our ongoing work to improve device scaling and further reduce parasitic capacitance, and realize high-performance printed submicrometer OTFT devices and circuits
  • Keywords
    nanostructured materials; polymer films; thin film transistors; bottom-up printing; conductive polymers; device scaling; droplet contact line; functional conductive nanostructures; gold conductivity; gold nanoparticle ink; heterogeneous surfaces; ink droplet motion; nanoscale critical features; parasitic capacitance; polymer thin-film transistors; printed submicrometer OTFT devices; printed submicron organic transistors; self-aligned printing; thin-film transistor; Conductivity; Fabrication; Gold; Ink; Motion control; Nanostructures; Physics; Polymer films; Printing; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2006. IEDM '06. International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    1-4244-0439-8
  • Electronic_ISBN
    1-4244-0439-8
  • Type

    conf

  • DOI
    10.1109/IEDM.2006.346765
  • Filename
    4154184