DocumentCode :
2386487
Title :
Investigation of the trap states in quenched and annealed nylon 6 films using thermally stimulated depolarization current
Author :
Zhu, J. ; Zhang, X.Y. ; Dai, J.B. ; Chan, H.L.W.
Author_Institution :
Dept. of Polymer Sci. & Eng., Univ. of Sci. & Technol. of China, Hefei, China
fYear :
2002
fDate :
2002
Firstpage :
126
Lastpage :
129
Abstract :
Quenched and annealed nylon 6 films were prepared and their short-circuit thermally stimulated depolarization current (TSDC) has been measured using a modified thermal electric analyzer. The space charge peak in the temperature range of 90°C∼180°C observed in the TSDC spectra of different samples showed that the trap state of the films shifted to lower temperature as annealing time increased. In general, the trap state became shallower in the annealed sample. The result was consistent with the structural transition of quenched β form to annealed α form. FTIR spectrum and X-ray diffraction were also used to examine the transition. According to the analysis of the phase transition, structural origin of the TSDC peaks has been proposed.
Keywords :
Fourier transform spectra; X-ray diffraction; annealing; dielectric thin films; electron traps; infrared spectra; polymer films; polymer structure; quenching (thermal); solid-state phase transformations; space charge; thermally stimulated currents; 90 to 180 C; FTIR spectrum; TSDC; TSDC spectra; X-ray diffraction; annealed α form; annealed nylon 6 films; annealing time; modified thermal electric analyzer; phase transition; quenched β form; quenched nylon 6 films; short-circuit thermally stimulated depolarization; space charge peak; structural transition; thermally stimulated depolarization current; trap states; Annealing; Crystallization; Materials science and technology; Physics; Polarization; Polymers; Space charge; Temperature distribution; Thermal quenching; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
Print_ISBN :
0-7803-7560-2
Type :
conf
DOI :
10.1109/ISE.2002.1042960
Filename :
1042960
Link To Document :
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