• DocumentCode
    238652
  • Title

    Automatic Target Recognition using multiple-aspect sonar images

  • Author

    Xiaoguang Wang ; Xuan Liu ; Japkowicz, Nathalie ; Matwin, S. ; Bao Nguyen

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Univ. of Ottawa, Ottawa, ON, Canada
  • fYear
    2014
  • fDate
    6-11 July 2014
  • Firstpage
    2330
  • Lastpage
    2337
  • Abstract
    Automatic Target Recognition (ATR) methods have been successfully applied to detect possible objects or regions of interest in sonar imagery. It is anticipated that the additional information obtained from additional views of an object should improve the classification performance over single-aspect classification. In this paper the detection of mine-like objects (MLO) on the seabed from multiple side-scan sonar views is considered. We transform the multiple-aspect classification problem into a multiple-instance learning problem and present a framework based upon the concepts of multiple-instance classifiers. Moreover, we present another framework based upon the Dempster-Shafer (DS) concept of fusion from single-view classifiers. Our experimental results indicate that both the presented frameworks can be successfully used in mine-like object classification.
  • Keywords
    image classification; image fusion; inference mechanisms; learning (artificial intelligence); object detection; object recognition; sonar imaging; uncertainty handling; ATR methods; DS; Dempster-Shafer concept; MLO detection; automatic target recognition; classifier fusion; mine-like objects; multiple-aspect classification; multiple-aspect sonar images; multiple-instance learning problem; object detection; side-scan sonar view; single-aspect classification; sonar imagery; Image edge detection; Image segmentation; Logistics; Shape; Sonar detection; Support vector machine classification; Automatic Target Recognition; multiple-instance learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Evolutionary Computation (CEC), 2014 IEEE Congress on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-6626-4
  • Type

    conf

  • DOI
    10.1109/CEC.2014.6900261
  • Filename
    6900261