Title :
Application of capacitive displacement sensor to testing temperature stress of seamless rail
Author :
Li, Xu ; Ding, Jiexiong
Keywords :
Capacitance measurement; Capacitive sensors; Circuits; Electrodes; Parasitic capacitance; Rails; Strain measurement; Stress measurement; Temperature sensors; Testing;
Conference_Titel :
Intelligent Mechatronics and Automation, 2004. Proceedings. 2004 International Conference on
Print_ISBN :
0-7803-8748-1
DOI :
10.1109/ICIMA.2004.1384304