• DocumentCode
    2390841
  • Title

    Determining waveguide coupling efficiency by observing reflected light from the end face

  • Author

    Fan, Regis ; Delen, Nuri ; Hooker, Brian

  • Author_Institution
    Optoelectron. Comput. Syst. Center, Colorado Univ., Boulder, CO, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    431
  • Lastpage
    433
  • Abstract
    The amount of light coupled into a waveguide depends on end-face irregularities. We have developed a technique to assess the light coupling performance of waveguides by measuring their back reflected light characteristics. The reflected light can be separated into two parts, the specular and the diffuse reflected light. The amount of each gives us information on how well light can be coupled into a waveguide. This technique is especially useful in integrated optics made of polymer materials where end face quality is a strong function of the material preparation technique and processing
  • Keywords
    integrated optics; light reflection; light scattering; optical couplers; back reflected light characteristics; diffuse reflected light; end-face irregularities; integrated optics; light coupling performance; material preparation technique; polymer materials; specular reflected light; waveguide coupling efficiency; Atomic force microscopy; Optical coupling; Optical surface waves; Optical waveguides; Rough surfaces; Scanning electron microscopy; Surface roughness; Surface waves; Waveguide components; Waveguide theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.515317
  • Filename
    515317