• DocumentCode
    2390930
  • Title

    Combined H-feedback and eterative learning control design with application to nanopositioning systems

  • Author

    Helfrich, B.E. ; Lee, C. ; Bristow, D.A. ; Xiao, X.H. ; Dong, J. ; Alleyne, A.G. ; Salapaka, S.M. ; Ferreira, P.M.

  • Author_Institution
    Mech. Sci. & Eng. Dept., Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • fYear
    2008
  • fDate
    11-13 June 2008
  • Firstpage
    3893
  • Lastpage
    3900
  • Abstract
    This paper presents a coordinated design framework for precision motion control (PMC) systems. In particular, the focus is on the design of feedback and feedforward controllers operating on systems that repeatedly perform the same tasks. The repetitive nature of the tasks suggests the use of Iterative Learning Control (ILC). However, in addition to the repeatability of the desired trajectory, the class of systems under study examines the effect of non-repeating disturbances and possible reset errors. The rejection of uncertain, but bounded, disturbances suggests the use of H infin design. The non-repeating disturbances and reset errors necessitate coordination of the feedback and feedforward designs. The assumption that the disturbances have a particular frequency distribution affords a frequency domain separation between the two controller degrees of freedom. Experimental results are given on a piezo-driven nanopositioning device demonstrating the benefits to the presented approach.
  • Keywords
    Hinfin control; adaptive control; control system synthesis; feedforward; iterative methods; learning systems; motion control; nanopositioning; Hinfin feedback; ILC; PMC; feedforward controllers; feedforward designs; iterative learning control design; nonrepeating disturbances; piezo-driven nanopositioning device; precision motion control systems; Atomic force microscopy; Control design; Control systems; Feedback; Frequency domain analysis; Manufacturing; Motion control; Nanopositioning; Resonance; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2008
  • Conference_Location
    Seattle, WA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-2078-0
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2008.4587101
  • Filename
    4587101