DocumentCode
2391076
Title
Dimensional measurements of a silicon sphere
Author
Nicolaus, R.A. ; Bonsch, G.
Author_Institution
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
fYear
1996
fDate
17-21 June 1996
Firstpage
167
Lastpage
168
Abstract
For a precision determination of Avogadro´s constant, N/sub A/, the volume of a nearly perfect silicon sphere of 1 kg and about 90 mm diameter, made of a single-crystal, is to be measured with a relative uncertainty of 10/sup -7/. For this, a new interferometric method is used to measure the diameter and its variations in large number of orientations with uncertainties in the sub-nm range.
Keywords
constants; light interferometry; silicon; volume measurement; Avogadro constant; Si; dimensional measurements; interferometric method; silicon sphere; single crystal; volume measurement; Cameras; Interference; Lenses; Optical interferometry; Optical refraction; Optical surface waves; Optical variables control; Performance evaluation; Silicon; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.546754
Filename
546754
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