Title :
Ultra High-speed Novel Bulk Thyristor-SRAM (BT-RAM) Cell with Selective Epitaxy Anode (SEA)
Author :
Sugizaki, T. ; Nakamura, M. ; Yanagita, M. ; Honda, M. ; Shinohara, M. ; Ikuta, T. ; Ohchi, T. ; Kugimiya, K. ; Yamamoto, R. ; Kanda, S. ; Yamamura, I. ; Yagami, K. ; Oda, T.
Author_Institution :
Sony Corp., Kanagawa
Abstract :
We developed novel SRAM cells using bulk thyristor-RAM (BT-RAM). BT-RAM, formed on bulk Si wafers, is low cost and has good compatibility with logic process flows. BT-RAM has excellent performance, with a 100-ps read/write, high Ion/Ioff current ratio (> 108), and low standby current (< 0.5 nA/cell). We can expect the ideal cell size to be as low as 30 F2, one-fourth that of a conventional 6T-SRAM cell, by using selective epitaxy technique for anode regions (SEA). BT-RAM provides us with solutions to many inherent problems in 6T-SRAM in the 65-nm generation and beyond
Keywords :
SRAM chips; doping profiles; thyristors; 100 ps; 6T-SRAM; BT-RAM cell; Si; logic process flows; selective epitaxy anode; ultra high-speed bulk thyristor-SRAM; Anodes; Costs; Doping profiles; Epitaxial growth; Interference; Logic devices; Noise reduction; Random access memory; Thyristors; Voltage;
Conference_Titel :
Electron Devices Meeting, 2006. IEDM '06. International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0438-X
Electronic_ISBN :
1-4244-0439-8
DOI :
10.1109/IEDM.2006.346984