DocumentCode
2391287
Title
The mean depth of trap level of oriented, crystallized and γ-irradiated poly(ethylene terephthalate) electrets
Author
Zhang, Xingyuan ; Zhou, Yiqin ; Zhang, Jixiang
Author_Institution
Dept. of Appl. Chem., Univ. of Sci. & Technol. of China, Hefei, China
fYear
1991
fDate
25-27 Sep 1991
Firstpage
55
Lastpage
60
Abstract
The mean depth of trap level is increased with increasing degree of planar orientation, crystallinity, and irradiation done in oriented, crystallized, and γ-irradiated PET electrets. The order of variation range for the trap depth is drawn, γ-irradiated, and annealed sample. Three kinds of trap models are proposed corresponding to the three methods of sample treatment on the basis of the depth of trap level, the current maximum of detrapping charge carriers, and the initial density of charge carriers
Keywords
annealing; carrier density; electrets; electron traps; gamma-ray effects; hole traps; polymers; annealed sample; crystallinity; density of charge carriers; detrapping charge carriers; gamma -irradiated PET electrets; planar orientation; poly(ethylene terephthalate; trap depth; trap level; Annealing; Charge carriers; Crystallization; Electrets; Infrared detectors; Infrared spectra; Optical films; Polymers; Positron emission tomography; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 1991. (ISE 7) Proceedings., 7th International Symposium on (Cat. No.91CH3029-6)
Conference_Location
Berlin
Print_ISBN
0-7803-0112-9
Type
conf
DOI
10.1109/ISE.1991.167182
Filename
167182
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