• DocumentCode
    2391287
  • Title

    The mean depth of trap level of oriented, crystallized and γ-irradiated poly(ethylene terephthalate) electrets

  • Author

    Zhang, Xingyuan ; Zhou, Yiqin ; Zhang, Jixiang

  • Author_Institution
    Dept. of Appl. Chem., Univ. of Sci. & Technol. of China, Hefei, China
  • fYear
    1991
  • fDate
    25-27 Sep 1991
  • Firstpage
    55
  • Lastpage
    60
  • Abstract
    The mean depth of trap level is increased with increasing degree of planar orientation, crystallinity, and irradiation done in oriented, crystallized, and γ-irradiated PET electrets. The order of variation range for the trap depth is drawn, γ-irradiated, and annealed sample. Three kinds of trap models are proposed corresponding to the three methods of sample treatment on the basis of the depth of trap level, the current maximum of detrapping charge carriers, and the initial density of charge carriers
  • Keywords
    annealing; carrier density; electrets; electron traps; gamma-ray effects; hole traps; polymers; annealed sample; crystallinity; density of charge carriers; detrapping charge carriers; gamma -irradiated PET electrets; planar orientation; poly(ethylene terephthalate; trap depth; trap level; Annealing; Charge carriers; Crystallization; Electrets; Infrared detectors; Infrared spectra; Optical films; Polymers; Positron emission tomography; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 1991. (ISE 7) Proceedings., 7th International Symposium on (Cat. No.91CH3029-6)
  • Conference_Location
    Berlin
  • Print_ISBN
    0-7803-0112-9
  • Type

    conf

  • DOI
    10.1109/ISE.1991.167182
  • Filename
    167182