DocumentCode :
2391295
Title :
10 Gb/s modulator driver IC with ultra high gain and compact size using composite lumped-distributed amplifier approach
Author :
Jinho Jeong ; Youngwoo Kwon
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., South Korea
fYear :
2003
fDate :
9-12 Nov. 2003
Firstpage :
149
Lastpage :
152
Abstract :
In this paper, a 10 Gb/s modulator driver MMIC is presented using a composite lumped-distributed amplifier approach, which allows a very compact chip size with ultra high gain and high output voltage swing. The chip size is further reduced using double-input distributed amplifier topology. The designed modulator driver is fabricated using a depletion-mode 0.15 /spl mu/m GaAs pHEMT process. The chip size is as small as 1.1 mm/spl times/1.9 mm. Measured small-signal gain is as high as 31.5 dB with 3 dB bandwidth of 15.0 GHz and good input/output return losses. The measured eye diagram shows clear eye open and output voltage swing of 7.4 V/sub pp/ at the input of 10 Gb/s 2/sup 23/-1 pseudorandom NRZ data. The input swing is 0.22 V/sub pp/. To the knowledge of the authors, this result is among the highest gain per chip area with high output voltage swing for 10 Gb/s modulator driver ICs.
Keywords :
HEMT integrated circuits; III-V semiconductors; distributed amplifiers; driver circuits; electro-optical modulation; field effect MMIC; gallium arsenide; lumped parameter networks; optical fibre communication; 0.15 micron; 0.22 V; 1.1 mm; 1.9 mm; 10 Gbit/s; 15.0 GHz; 31.5 dB; 7.4 V; GaAs; MMIC; composite lumped-distributed amplifier; double-input distributed amplifier topology; fiber-optic communication; high output voltage swing; input/output return losses; modulator driver IC; pHEMT process; Distributed amplifiers; Driver circuits; Gain measurement; Gallium arsenide; MMICs; PHEMTs; Semiconductor device measurement; Signal analysis; Topology; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003. 25th Annual Technical Digest 2003. IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
1064-7775
Print_ISBN :
0-7803-7833-4
Type :
conf
DOI :
10.1109/GAAS.2003.1252383
Filename :
1252383
Link To Document :
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