• DocumentCode
    2391599
  • Title

    Design and fabrication of condenser microphone using wafer transfer and micro-electroplating technique

  • Author

    Shu, Zhen-Zhun ; Ke, Ming-Li ; Chen, Guan-Wei ; Horng, Ray-Hua ; Chang, Chao-Chih ; Tsai, Jean-Yih ; Lai, Chung-Ching ; Chen, Ji-Liang

  • Author_Institution
    Inst. of Precision Eng., Nat. Chung Hsing Univ., Taichung
  • fYear
    2008
  • fDate
    9-11 April 2008
  • Firstpage
    386
  • Lastpage
    390
  • Abstract
    A novel fabrication process, which uses wafer transfer and micro-electroplating technique, has been proposed and tested. In this paper, the effects of the diaphragm thickness andstress, the air-gap thickness, and the area ratio of acoustic holes to backplate on the sensitivity of the condenser microphone have been demonstrated since the performance of the microphone depends on these parameters. The microphone diaphragm has been designed with a diameter and thickness of 1.9 mm and 0.6 mum, respectively, an air-gap thickness of 10 mum, and a 24% area ratio of acoustic holes to backplate. To obtain a lower initial stress, the material used for the diaphragm is polyimide. The measured sensitivities of the microphone at the bias voltages of 24 V and12 V are -45.3 and -50.2 dB/Pa (at 1 kHz), respectively. The fabricated microphone shows aflat frequency response extending to 20 kHz.
  • Keywords
    capacitors; diaphragms; electroplating; frequency response; microphones; microsensors; acoustic hole-to-backplate area ratio; air-gap thickness; bias voltages; condenser microphone; diaphragm; flat frequency response; frequency 20 kHz; micro-electroplating technique; sensitivities; size 0.6 mum; size 1.9 mm; size 10 mum; voltage 12 V; voltage 24 V; wafer transfer; Acoustic transducers; Air gaps; Electronic equipment testing; Fabrication; Frequency; Microphones; Polyimides; Silicon; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS, 2008. MEMS/MOEMS 2008. Symposium on
  • Conference_Location
    Nice
  • Print_ISBN
    978-2-35500-006-5
  • Type

    conf

  • DOI
    10.1109/DTIP.2008.4753025
  • Filename
    4753025