DocumentCode :
2392516
Title :
Characterization of thin ZnO film by optical second harmonic generation: experiment and theory
Author :
Buinitskaya, G. ; Kravetsky, I. ; Kulyuk, L. ; Mirovitskii, V. ; Rusu, E.
Author_Institution :
Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldova
Volume :
2
fYear :
2003
fDate :
28 Sept.-2 Oct. 2003
Abstract :
Thin polycrystalline zinc oxide film deposed on glass substrate have been investigated by optical second harmonic generation (SHG). The intensity of SHG in dependence of rotation angle of fundamental beam polarization for several incident angles has been measured. Developed theoretical model taking into account multiple reflections of light into the sample allows us to reveal a set of effective characteristics of film.
Keywords :
II-VI semiconductors; optical harmonic generation; semiconductor thin films; zinc compounds; ZnO; fundamental beam polarization; glass substrate; optical second harmonic generation; polycrystalline film; rotation angle; thin ZnO film; Glass; Goniometers; Nonlinear optics; Optical films; Optical harmonic generation; Optical polarization; Optical reflection; Rotation measurement; Substrates; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2003. CAS 2003. International
Print_ISBN :
0-7803-7821-0
Type :
conf
DOI :
10.1109/SMICND.2003.1252444
Filename :
1252444
Link To Document :
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