Title :
Characterization of thin ZnO film by optical second harmonic generation: experiment and theory
Author :
Buinitskaya, G. ; Kravetsky, I. ; Kulyuk, L. ; Mirovitskii, V. ; Rusu, E.
Author_Institution :
Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldova
fDate :
28 Sept.-2 Oct. 2003
Abstract :
Thin polycrystalline zinc oxide film deposed on glass substrate have been investigated by optical second harmonic generation (SHG). The intensity of SHG in dependence of rotation angle of fundamental beam polarization for several incident angles has been measured. Developed theoretical model taking into account multiple reflections of light into the sample allows us to reveal a set of effective characteristics of film.
Keywords :
II-VI semiconductors; optical harmonic generation; semiconductor thin films; zinc compounds; ZnO; fundamental beam polarization; glass substrate; optical second harmonic generation; polycrystalline film; rotation angle; thin ZnO film; Glass; Goniometers; Nonlinear optics; Optical films; Optical harmonic generation; Optical polarization; Optical reflection; Rotation measurement; Substrates; Zinc oxide;
Conference_Titel :
Semiconductor Conference, 2003. CAS 2003. International
Print_ISBN :
0-7803-7821-0
DOI :
10.1109/SMICND.2003.1252444
