• DocumentCode
    2392913
  • Title

    FPgen - a test generation framework for datapath floating-point verification

  • Author

    Aharoni, Merav ; Asaf, Sigal ; Fournier, L. ; Koifman, Anatoly ; Nagel, Raviv

  • Author_Institution
    IBM Haifa Res. Labs., Israel
  • fYear
    2003
  • fDate
    12-14 Nov. 2003
  • Firstpage
    17
  • Lastpage
    22
  • Abstract
    FPgen is a new test generation framework targeted toward the verification of the floating point (FP) datapath, through the generation of test cases. This framework provides the capacity to define virtually any architectural FP coverage model, consisting of verification tasks. The tool supplies strong constraint solving capabilities, allowing the generation of random tests that target these tasks. We present an overview of FPgen´s functionality, describe the results of its use for the verification of several FP units, and compare its efficiency with existing test generators.
  • Keywords
    automatic test pattern generation; constraint handling; floating point arithmetic; high level synthesis; software tools; FPgen a test generation framework; architectural coverage model; constraint solving capabilities; data constraints; datapath floating-point verification; high level description; random tests; simulation-based verification; verification tasks; Computer bugs; Debugging; Formal verification; Investments; Manuals; Microprocessors; Power generation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-8236-6
  • Type

    conf

  • DOI
    10.1109/HLDVT.2003.1252469
  • Filename
    1252469