DocumentCode
2392913
Title
FPgen - a test generation framework for datapath floating-point verification
Author
Aharoni, Merav ; Asaf, Sigal ; Fournier, L. ; Koifman, Anatoly ; Nagel, Raviv
Author_Institution
IBM Haifa Res. Labs., Israel
fYear
2003
fDate
12-14 Nov. 2003
Firstpage
17
Lastpage
22
Abstract
FPgen is a new test generation framework targeted toward the verification of the floating point (FP) datapath, through the generation of test cases. This framework provides the capacity to define virtually any architectural FP coverage model, consisting of verification tasks. The tool supplies strong constraint solving capabilities, allowing the generation of random tests that target these tasks. We present an overview of FPgen´s functionality, describe the results of its use for the verification of several FP units, and compare its efficiency with existing test generators.
Keywords
automatic test pattern generation; constraint handling; floating point arithmetic; high level synthesis; software tools; FPgen a test generation framework; architectural coverage model; constraint solving capabilities; data constraints; datapath floating-point verification; high level description; random tests; simulation-based verification; verification tasks; Computer bugs; Debugging; Formal verification; Investments; Manuals; Microprocessors; Power generation; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-8236-6
Type
conf
DOI
10.1109/HLDVT.2003.1252469
Filename
1252469
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