A rapid defect detecting algorithm for printed matter on the assembly line

Author

Ximing Yang ; Shuanhu Wu

Author_Institution

Sch. of Comput. Sci., Yantai Univ., Yantai, China

fYear

2012

fDate

19-20 May 2012

Firstpage

1842

Lastpage

1845

Abstract

To better adapt to defect detection requirements of the industrial printed matter on the assembly line, this paper proposed a rapid defect detection algorithm. First we improved the Surf algorithm and made better the detection of the feature point performance and speed effectively; Second, a new FIFO feature point matching algorithm was introduced that could save feature matching time about 50%; Finally we introduced a two-way image difference algorithm to avoid error detecting for contour artifact. Experimental results showed that the proposed algorithm could meet real-time requirements on assembly line.

Keywords

assembling; feature extraction; image matching; object detection; production engineering computing; quality control; FIFO feature point matching algorithm; SURF algorithm; assembly line; contour artifact; error detection; feature point performance; first-in first-out; industrial printed matter; rapid defect detection algorithm; speeded-up robust feature; two-way image difference algorithm; Algorithm design and analysis; Assembly; Educational institutions; Feature extraction; Image matching; Standards; Vectors; Defect detection; FIFO feature point matching; Two-way image difference;

fLanguage

English

Publisher

ieee

Conference_Titel

Systems and Informatics (ICSAI), 2012 International Conference on

Conference_Location

Yantai

Print_ISBN

978-1-4673-0198-5

Type

conf

DOI

10.1109/ICSAI.2012.6223405

Filename

6223405