• DocumentCode
    2396449
  • Title

    A Novel Technique For The Measurement Of Photoenhanced Electron Attachment: Implications For An Optically-controlled Diffuse Discharge Opening Switch

  • Author

    Pinnaduwage, Lal A. ; Christophoicu, L.G.

  • Author_Institution
    Oak Ridge National Laboratory
  • fYear
    1991
  • fDate
    16-19 June 1991
  • Firstpage
    486
  • Lastpage
    490
  • Abstract
    Enhanced electron attachment to transient electron attaching species, such as electronically-excited molecules produced via laser irradiation, could be employed to switch conduction/insulation properties of a gaseous medium and has potential applications in diffuse-discharge opening switches. In this paper, we discuss a new technique that is capable of measurement of enhanced electron attachment to very short-lived (lifetime < 10/sup -8/s) electron attaching species. We also report measurements carried out using this technique on superexcited states (electronically-excited states lying above the first ionization threshold) of triethylamine and nitric oxide; these exhibit several orders of magnitude enhancement in electron attachment compared to the corresponding ground electronic states. Implications of such measurements for an optically-controlled diffuse discharge opening switch are indicated.
  • Keywords
    Atom optics; Atomic beams; Electron optics; Inductors; Ionization; Joining processes; Laser excitation; Optical pulses; Optical switches; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1991. Digest of Technical Papers. Eighth IEEE International
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    0-7803-0177-3
  • Type

    conf

  • DOI
    10.1109/PPC.1991.733327
  • Filename
    733327