DocumentCode
2397064
Title
Combining appearance models and Markov Random Fields for category level object segmentation
Author
Larlus, Diane ; Jurie, Frédéric
Author_Institution
LEAR, INRIA, Paris
fYear
2008
fDate
23-28 June 2008
Firstpage
1
Lastpage
7
Abstract
Object models based on bag-of-words representations can achieve state-of-the-art performance for image classification and object localization tasks. However, as they consider objects as loose collections of local patches they fail to accurately locate object boundaries and are not able to produce accurate object segmentation. On the other hand, Markov random field models used for image segmentation focus on object boundaries but can hardly use the global constraints necessary to deal with object categories whose appearance may vary significantly. In this paper we combine the advantages of both approaches. First, a mechanism based on local regions allows object detection using visual word occurrences and produces a rough image segmentation. Then, a MRF component gives clean boundaries and enforces label consistency, guided by local image cues (color, texture and edge cues) and by long-distance dependencies. Gibbs sampling is used to infer the model. The proposed method successfully segments object categories with highly varying appearances in the presence of cluttered backgrounds and large view point changes. We show that it outperforms published results on the Pascal VOC 2007 dataset.
Keywords
Markov processes; image colour analysis; image representation; image sampling; image segmentation; image texture; random processes; Markov random field models; Markov random fields; Pascal VOC 2007 dataset; category level object segmentation; image classification; label consistency; local image cues; visual word occurrences; Data mining; Image classification; Image edge detection; Image sampling; Image segmentation; Iterative algorithms; Markov random fields; Object detection; Object segmentation; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location
Anchorage, AK
ISSN
1063-6919
Print_ISBN
978-1-4244-2242-5
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2008.4587453
Filename
4587453
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