Title :
A module-sliced high yield WSI memory system
Author :
Chang, Yi-Chieh ; Jorge, Saji ; Kim, Jung Hwan
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., El Paso, TX, USA
Abstract :
Low yield is one of the practical difficulties in the design of WSI systems, such as array processors or WSI memories. The conventional row-column memory cells organization is not suitable for WSI memory systems due to the long signal delay on a wafer and a much more complicate procedure for replacing a defect row or column of memory cell. To alleviate these difficulties, a module-sliced WSI memory system is proposed for high yield WSI memory systems. The basic unit of the WSI memory system is a module which consists of a memory bank, a module comparator, a module register, and a row-column decoder. The WSI memory system is organized in a two level row/column structure. The first level is a two dimensional mesh with the basic unit of a module. Within each module, i.e. the second level, the memory bank is organized in a conventional rows and columns of memory cells
Keywords :
fault tolerant computing; integrated circuit yield; integrated memory circuits; memory architecture; modules; wafer-scale integration; WSI memories; array processors; memory bank; module comparator; module register; module-sliced system; row-column decoder; row-column memory cells; two dimensional mesh; yield; Decoding; Delay; Fault tolerance; Fault tolerant systems; Hardware; Indium; Registers; Signal processing; Very large scale integration; Wafer scale integration;
Conference_Titel :
Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2467-6
DOI :
10.1109/ICWSI.1995.515442