DocumentCode
2397205
Title
Time redundancy for error detecting neural networks
Author
Hsu, Yuang-Ming ; Piuri, Vincenzo ; Swartzlander, Earl E., Jr.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear
1995
fDate
18-20 Jan 1995
Firstpage
111
Lastpage
121
Abstract
Concurrent error detection at an architectural level is often a basic requirement to achieve fault tolerance in neural networks for mission-critical applications. Time redundancy allows for concurrent error detection with low circuit complexity. In this paper, the use of alternating logic and complemented logic are analyzed as low-cost approaches to concurrent error detection. Different architectural approaches for the neural network design are considered to march the implementation constraints
Keywords
error detection; fault tolerant computing; neural net architecture; neural nets; redundancy; alternating logic; circuit complexity; complemented logic; concurrent error detection; fault tolerance; mission-critical applications; neural network architecture; time redundancy; Circuit faults; Complexity theory; Computer errors; Computer networks; Error correction; Fault detection; Logic; Mission critical systems; Neural networks; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-2467-6
Type
conf
DOI
10.1109/ICWSI.1995.515444
Filename
515444
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