• DocumentCode
    2397205
  • Title

    Time redundancy for error detecting neural networks

  • Author

    Hsu, Yuang-Ming ; Piuri, Vincenzo ; Swartzlander, Earl E., Jr.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • fYear
    1995
  • fDate
    18-20 Jan 1995
  • Firstpage
    111
  • Lastpage
    121
  • Abstract
    Concurrent error detection at an architectural level is often a basic requirement to achieve fault tolerance in neural networks for mission-critical applications. Time redundancy allows for concurrent error detection with low circuit complexity. In this paper, the use of alternating logic and complemented logic are analyzed as low-cost approaches to concurrent error detection. Different architectural approaches for the neural network design are considered to march the implementation constraints
  • Keywords
    error detection; fault tolerant computing; neural net architecture; neural nets; redundancy; alternating logic; circuit complexity; complemented logic; concurrent error detection; fault tolerance; mission-critical applications; neural network architecture; time redundancy; Circuit faults; Complexity theory; Computer errors; Computer networks; Error correction; Fault detection; Logic; Mission critical systems; Neural networks; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2467-6
  • Type

    conf

  • DOI
    10.1109/ICWSI.1995.515444
  • Filename
    515444