DocumentCode
2397290
Title
Using fast-scan cyclic voltammetry to evaluate striatal dopamine release elicited by subthalamic nucleus stimulation
Author
Covey, Dan P. ; Garris, Paul A.
Author_Institution
Depts. of Chem. & Psychol., Illinois State Univ., Normal, IL, USA
fYear
2009
fDate
3-6 Sept. 2009
Firstpage
3306
Lastpage
3309
Abstract
Deep brain stimulation (DBS), an effective neurosurgical therapy for Parkinson´s disease (PD), may act via eliciting neurotransmitter release. However, the precise relationships between DBS and neurotransmitter release are not established. One issue in these studies may be analytical limitations of microdialysis and positron emission tomography, the primary measurement technologies employed. Limitations may be overcome by microsensors, which exhibit improved temporal and spatial resolution. Here we assess fast-scan cyclic voltammetry (FSCV) at a carbon-fiber microelectrode (CFM) for monitoring a putative DBS neurotransmitter, dopamine, during stimulation of the subthalamic nucleus (STN), a DBS target for PD. These results, obtained in the anesthetized rat, suggest that real-time microsensors are a suitable approach for testing the neurotransmitter release hypothesis of DBS action.
Keywords
bioelectric phenomena; biomedical electrodes; biosensors; brain; diseases; microsensors; neurophysiology; voltammetry (chemical analysis); FSCV; Parkinson disease; anesthetized rat; carbon-fiber microelectrode; deep brain stimulation; fast-scan cyclic voltammetry; microdialysis; neurosurgical therapy; positron emission tomography; putative DBS neurotransmitter; real-time microsensors; striatal dopamine release; subthalamic nucleus stimulation; Animals; Brain; Deep Brain Stimulation; Disease Models, Animal; Dopamine; Electric Stimulation; Electrophysiology; Male; Microelectrodes; Neurotransmitter Agents; Parkinson Disease; Rats; Rats, Sprague-Dawley; Subthalamic Nucleus; Time Factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location
Minneapolis, MN
ISSN
1557-170X
Print_ISBN
978-1-4244-3296-7
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2009.5333768
Filename
5333768
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