• DocumentCode
    2397592
  • Title

    On the test quality evaluation of current testing techniques

  • Author

    Thibeault, C.

  • Author_Institution
    Dept. of Electr. Eng., Ecole de technologie superleure, Montreal, Que.
  • fYear
    2005
  • fDate
    1-1 May 2005
  • Firstpage
    16
  • Lastpage
    22
  • Abstract
    This paper presents a new defect level/yield loss framework to estimate test quality of current testing techniques. We use this framework to compare the traditional IDDQ single-threshold approach to alternative techniques such as current ratios and a new one based on multiple thresholds. Results show that the choice of a current testing technique (and the setting of thresholds) greatly depends on the defect level target. Results also reveal that the multiple-threshold technique offers the lowest yield loss
  • Keywords
    integrated circuit testing; integrated circuit yield; current testing technique; defect level framework; defect level target; multiple-threshold technique; single-threshold approach; test quality evaluation; yield loss framework; Application specific integrated circuits; Delay estimation; Histograms; Integrated circuit testing; Phase estimation; Production; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on
  • Conference_Location
    Palm Springs, CA
  • Print_ISBN
    1-4244-0034-1
  • Type

    conf

  • DOI
    10.1109/DBT.2005.1531296
  • Filename
    1531296
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2397592