DocumentCode :
2399413
Title :
Bus pumping at Gbits/s rate on MCM
Author :
Lo, Tin-chee ; Katopis, George A. ; McAllister, Michael F. ; Vakirtzis, Charlie K. ; Becker, Dale
Author_Institution :
Syst./390 Div., IBM Corp., Poughkeepsie, NY, USA
fYear :
1998
fDate :
26-28 Oct 1998
Firstpage :
17
Lastpage :
20
Abstract :
The roadmaps of high-end server performance strongly suggest that 1 GHz processors will be a reality early in the next century. This trend creates the requirement of a commensurate increase of the speed of the off chip interconnects so that the bus bandwidth between the processor and the L2 cache chips can be maintained without an explosion of the chip I/Os. However, this increase in interconnect speed can not be achieved by decreasing the physical distance between the chips because the number of processors in an SMP system keeps increasing (Mak, 1997). It follows that data storage on the transmission line is the only way to satisfy these diverse requirements. This technique has been used successfully in the past by IBM bipolar mainframes but at much lower operating frequencies and on FR4 board lines which have much smaller resistance than the transmission lines embedded in polyimide (thin film) or even those embedded in glass ceramic. Therefore, we have designed the experiment that this paper describes in order to establish the feasibility of 1 Gbit/s transmission rate on glass ceramic and thin film lines and verify the validity of our simulation models in this frequency range
Keywords :
cache storage; ceramic packaging; design of experiments; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; integrated circuit testing; integrated memory circuits; microprocessor chips; multichip modules; network servers; system buses; 1 GHz; 1 Gbit/s; FR4 board lines; L2 cache chips; MCM; SMP system; bus bandwidth; bus pumping; bus pumping rate; chip I/Os; designed experiment; embedded transmission lines; glass ceramic; glass ceramic lines; interconnect speed; intra-chip physical distance; microprocessors; off chip interconnect speed; off chip interconnects; operating frequency; polyimide thin film; resistance; server performance; simulation models; thin film lines; transmission line data storage; transmission rate; Ceramics; Couplings; Dielectric materials; Glass; Packaging; Polyimides; Power transmission lines; Testing; Transistors; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on
Conference_Location :
West Point, NY
Print_ISBN :
0-7803-4965-2
Type :
conf
DOI :
10.1109/EPEP.1998.733491
Filename :
733491
Link To Document :
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