Title :
Characterization of TFT/LCD arrays
Author :
Troutman, Ronald R. ; Jenkins, Leslie C. ; Polastre, Robert J. ; Wisnieff, Robert L.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Thin-film-transistor (TFT) array characterization is important to liquid-crystal display (LCD) design, development, failure analysis, and sorting on a manufacturing line. The authors present characterization highlights obtained using a TFT array tester that can detect, accurately locate, and in many cases identify both line faults and pixel faults in a TFT array. It can provide useful performance information on normally operating pixels.<>
Keywords :
automatic testing; electronic equipment testing; failure analysis; fault location; liquid crystal displays; production testing; thin film transistors; TFT array; TFT/LCD arrays; data line probes; failure analysis; gate line probes; line faults; manufacturing; pixel faults; production testing; sorting; Active matrix liquid crystal displays; Assembly; Circuit faults; Driver circuits; Failure analysis; Manufacturing; Performance evaluation; Probes; Software testing; Thin film transistors;
Conference_Titel :
Display Research Conference, 1991., Conference Record of the 1991 International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-0213-3
DOI :
10.1109/DISPL.1991.167477
