DocumentCode :
2400354
Title :
Visibility in bad weather from a single image
Author :
Tan, Robby T.
Author_Institution :
Commun. & Signal Process. Group, Imperial Coll. London, London
fYear :
2008
fDate :
23-28 June 2008
Firstpage :
1
Lastpage :
8
Abstract :
Bad weather, such as fog and haze, can significantly degrade the visibility of a scene. Optically, this is due to the substantial presence of particles in the atmosphere that absorb and scatter light. In computer vision, the absorption and scattering processes are commonly modeled by a linear combination of the direct attenuation and the airlight. Based on this model, a few methods have been proposed, and most of them require multiple input images of a scene, which have either different degrees of polarization or different atmospheric conditions. This requirement is the main drawback of these methods, since in many situations, it is difficult to be fulfilled. To resolve the problem, we introduce an automated method that only requires a single input image. This method is based on two basic observations: first, images with enhanced visibility (or clear-day images) have more contrast than images plagued by bad weather; second, airlight whose variation mainly depends on the distance of objects to the viewer, tends to be smooth. Relying on these two observations, we develop a cost function in the framework of Markov random fields, which can be efficiently optimized by various techniques, such as graph-cuts or belief propagation. The method does not require the geometrical information of the input image, and is applicable for both color and gray images.
Keywords :
Markov processes; computer vision; graph theory; image colour analysis; visibility; Markov random fields; absorption process; bad weather visibility; belief propagation; color image; computer vision; graph-cuts; gray images; scattering process; single image; Absorption; Atmosphere; Atmospheric modeling; Computer vision; Degradation; Layout; Light scattering; Optical attenuators; Optical scattering; Particle scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
ISSN :
1063-6919
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2008.4587643
Filename :
4587643
Link To Document :
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