DocumentCode
240206
Title
Contourlet domain image denoising using normal inverse gaussian distribution
Author
Sadreazami, H. ; Ahmad, M. Omair ; Swamy, M.N.S.
Author_Institution
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
fYear
2014
fDate
4-7 May 2014
Firstpage
1
Lastpage
4
Abstract
A new contourlet-based method is introduced for reducing noise in images corrupted by additive white Gaussian noise. It is shown that a symmetric normal inverse Gaussian distribution is more suitable for modeling the contourlet coefficients than formerly-used generalized Gaussian distribution. To estimate the noise-free coefficients, a Bayesian maximum a posteriori estimator is developed utilizing the proposed distribution. In order to estimate the parameters of the distribution, a moment-based technique is used. The performance of the proposed method is studied using typical noise-free images corrupted with simulated noise and compared with that of the other state-of-the-art methods. It is shown that compared with other denoising techniques, the proposed method gives higher values of the peak signal-to-noise ratio and provides images of good visual quality.
Keywords
AWGN; Bayes methods; Gaussian distribution; image denoising; maximum likelihood estimation; Bayesian maximum a posteriori estimator; additive white Gaussian noise; contourlet domain image denoising; moment-based technique; noise-free coefficient estimation; noise-free images; normal inverse gaussian distribution; signal-to-noise ratio; Bayes methods; Gaussian distribution; Image denoising; Noise; Noise measurement; Noise reduction; Transforms; Contourlet transform; image denoising; maximum a posterior estimator; normal inverse Gaussian distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering (CCECE), 2014 IEEE 27th Canadian Conference on
Conference_Location
Toronto, ON
ISSN
0840-7789
Print_ISBN
978-1-4799-3099-9
Type
conf
DOI
10.1109/CCECE.2014.6901077
Filename
6901077
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