DocumentCode
2403783
Title
Product reliability validation and continuous improvement program at ge energy
Author
Phillips, Randolph G. ; Vittal, Sameer
Author_Institution
GE Energy, Greenville, SC
fYear
2006
fDate
23-26 Jan. 2006
Firstpage
13
Lastpage
20
Abstract
The paper defines the process by which the individual businesses of GE Energy identify, prioritize, investigate, determine and implement effective long term corrective actions for technology-specific, top reliability issues that have significant impacts in terms of realized cost to both GE and its customers or present the greatest risk. The Product Reliability Validation and Continuous Improvement Program (hereby referred to by its ISO name of PG175) launches a new series of reliability tracking metrics along with delineation of responsibilities for generating them. A primary goal of the PG175 process is to develop effective long term corrective actions applied to design standards, design practices and all pertinent manufacturing, installation, maintenance and operational procedures that are sustainable and result in zero nature defects. The technology leader for each business are responsible for the implementation and ongoing efforts to drive projects to closure, report on progress and help achieve an orchestrated approach to reliability improvements throughout GE Energy. This paper will discuss the execution of PG175 across GE energy. To date the business has realized significant improvement in product reliability and well as cost reductions due to aftermarket product failure issues
Keywords
ISO standards; continuous improvement; cost reduction; maintenance engineering; product design; product development; reliability; GE Energy; PG175 process; aftermarket product failure; continuous improvement program; cost reductions; design standards; installation; maintenance engineering; pertinent manufacturing; product reliability validation; reliability tracking metrics; zero nature defects; Continuous improvement; Costs; Data analysis; ISO; Maintenance; Manufacturing processes; Paper technology; Reliability engineering; Testing; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
Conference_Location
Newport Beach, CA
ISSN
0149-144X
Print_ISBN
1-4244-0007-4
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2006.1677343
Filename
1677343
Link To Document