DocumentCode :
2403958
Title :
Analog VLSI circuits for manufacturing inspection
Author :
Morris, Tonia G. ; Wilson, Denise M. ; DeWeerth, Stephen P.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1995
fDate :
27-29 Mar 1995
Firstpage :
241
Lastpage :
255
Abstract :
We present three types of analog VLSI circuits that can be used in manufacturing inspection systems. The first set of circuits performs an adaptive threshold of an input image. The second circuit uses morphological operations with programmable structuring elements to detect oriented edges. Both of these circuits can be used as high speed preprocessors for visual inspection of manufacturing processes. The third circuit performs a computation necessary for selective attention in visual processing. This circuit is a component of a larger system that will facilitate a serial/parallel processing scheme in order to increase the speed of processing in machine vision tasks. Ail circuits presented use focal-plane processing to achieve their massively parallel architectures. For each design, the processing pixels contain vertical bipolar phototransistors to accommodate parallel optical inputs. All circuits have been fabricated using a standard 2.0 μm digital CMOS process. Data for each of these circuits is presented
Keywords :
CMOS analogue integrated circuits; VLSI; analogue processing circuits; automatic optical inspection; computer vision; edge detection; focal planes; manufacture; mathematical morphology; 2.0 micron; adaptive image threshold; analog VLSI circuits; digital CMOS process; focal-plane processing; high speed preprocessors; machine vision; manufacturing inspection; massively parallel architectures; morphological operations; oriented edge detection; programmable structuring elements; selective attention; serial/parallel processing; vertical bipolar phototransistors; Circuits; Image edge detection; Inspection; Machine vision; Manufacturing processes; Morphological operations; Optical design; Parallel architectures; Parallel processing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Research in VLSI, 1995. Proceedings., Sixteenth Conference on
Conference_Location :
Chapel Hill, NC
Print_ISBN :
0-8186-7074-9
Type :
conf
DOI :
10.1109/ARVLSI.1995.515624
Filename :
515624
Link To Document :
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