Title :
Measurement of the metal nanometer layer parameters on dielectric substrates using photonic crystals based on the waveguide structures with controlled irregularity in the microwave band
Author :
Usanov, Dmitry ; Skripal, Alexander ; Abramov, Anton ; Bogolubov, Anton ; Skvortsov, Vladimir ; Merdanov, Merdan
Author_Institution :
Saratov State Univ., Saratov
Abstract :
The results of investigations of the possibility of utilization of microwave photonic crystals with tunable irregularity instead of a "quarter-wave" dielectric layer for measurement of parameters of metal nanometer layers on dielectric substrates are presented. It has been shown that tuning the irregularity in the periodical structure of a photonic crystal allows one to tune the range of measurable metal layer\´s thickness from 1 till 500 nm.
Keywords :
dielectric materials; microwave materials; multilayers; nanotechnology; photonic crystals; reflectivity; controlled irregularity; dielectric substrate; metal nanometer layer parameter measurement; microwave band; microwave photonic crystals; waveguide structure; Biomedical measurements; Dielectric measurements; Dielectric substrates; Electromagnetic measurements; Frequency; Microwave bands; Microwave measurements; Nonhomogeneous media; Optical control; Photonic crystals;
Conference_Titel :
Microwave Conference, 2007. European
Conference_Location :
Munich
Print_ISBN :
978-2-87487-001-9
DOI :
10.1109/EUMC.2007.4405160
