Title :
Reduction of hysteretic propagation delay with less performance degradation by novel body contact in PD SOI application
Author :
Min, B.W. ; Kang, L. ; Wu, D. ; Caffo, D. ; Hayden, J. ; Mendicino, M.A.
Author_Institution :
Digital DNA Labs., Motorola Inc., Austin, TX, USA
Abstract :
A novel body contacted PDSOI MOSFET with double gate oxide integration at the body contact region is successfully demonstrated. It suppresses floating body effects without adding substantial gate loading capacitance in the body contact region, thus minimizing circuit performance degradation from the body contact region.
Keywords :
MOSFET; silicon-on-insulator; body contacted PDSOI MOSFET; circuit performance degradation; double gate oxide integration; floating body effects; hysteretic propagation delay; partially depleted SOI; MOSFETs; Silicon on insulator technology;
Conference_Titel :
SOI Conference, IEEE International 2002
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.2002.1044462