DocumentCode :
2406837
Title :
Reduction of hysteretic propagation delay with less performance degradation by novel body contact in PD SOI application
Author :
Min, B.W. ; Kang, L. ; Wu, D. ; Caffo, D. ; Hayden, J. ; Mendicino, M.A.
Author_Institution :
Digital DNA Labs., Motorola Inc., Austin, TX, USA
fYear :
2002
fDate :
7-10 Oct 2002
Firstpage :
169
Lastpage :
170
Abstract :
A novel body contacted PDSOI MOSFET with double gate oxide integration at the body contact region is successfully demonstrated. It suppresses floating body effects without adding substantial gate loading capacitance in the body contact region, thus minimizing circuit performance degradation from the body contact region.
Keywords :
MOSFET; silicon-on-insulator; body contacted PDSOI MOSFET; circuit performance degradation; double gate oxide integration; floating body effects; hysteretic propagation delay; partially depleted SOI; MOSFETs; Silicon on insulator technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, IEEE International 2002
Print_ISBN :
0-7803-7439-8
Type :
conf
DOI :
10.1109/SOI.2002.1044462
Filename :
1044462
Link To Document :
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