Title :
Film head domain observations at wafer processing level
Author :
Tong, H.C. ; Tayamballi, P. ; Bischoff, P. ; Shelor, R. ; Cormier, A.
Author_Institution :
Read-Rite Corporation
Keywords :
Bars; Frequency; Kerr effect; Magnetic heads; Magnetostriction; Micromagnetics; Microscopy; Probes; Shape; Stress;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696189
