NBTI and Leakage Reduction Using ILP-Based Approach

We propose an integer linear programming-based formulation to improve the effectiveness of the transmission gate-based technique intended to reduce negative-bias temperature instability and leakage power consumption. We also propose a virtual input pin technique to improve leakage reduction and use path sensitization to reduce area overhead. Simulation results show that combining these techniques can achieve >51.18% delay improvement and 63.34% leakage power improvement with only 2.31% area overhead.