Title :
Test solution for OTA based analog circuits
Author :
Ray, Baidya Nath ; Nandi, P.P. ; Nandi, P.K.
Author_Institution :
Electron. & Tele-Commun. Eng. Dept., Bengal Eng. Coll., Howrah, India
Abstract :
This paper reports a comprehensive solution for the problem of test and diagnosis of OTA based analog circuits. Based on the parametric deviation of circuit components, a test and diagnosis methodology is proposed. Compressed signature generated out of multiple performance parameters has resulted in significant enhancement in fault diagnosing capability. The voluminous response data has been handled with Cellular Automata (CA) based classifier to achieve excellent diagnostic resolution
Keywords :
analogue integrated circuits; cellular automata; fault diagnosis; integrated circuit testing; operational amplifiers; OTA based analog circuits; cellular automata based classifier; compressed signature generation; diagnosis methodology; multiple performance parameters; test methodology; Analog circuits; Circuit faults; Circuit testing; Computer science; Educational institutions; Fault diagnosis; Filters; Frequency; System testing; Transconductance;
Conference_Titel :
Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.
Conference_Location :
Bangalore
Print_ISBN :
0-7695-1441-3
DOI :
10.1109/ASPDAC.2002.995027
