Title :
Modeling and design of FETs in the temperature range from -50°C to +120°C oriented to low-power GaAs ICs CAD applying low-frequency design techniques
Author :
Giorgio, Agostino ; Perri, Anna Gina
Author_Institution :
Dipt. di Elettrotecnica ed Elettronica, Bari Univ., Italy
Abstract :
In this paper more efficient thermal design rules combined with an automatic procedure to determine the optimal layout for thermal effect optimization and new improved large/small signal thermal models of GaAs FETs are proposed. The small signal model is available also in the polynomial form required for thermal CAD of low-power MMICs, with low frequency ICs design technique based on physical parameters of the foundry. Therefore, a large signal thermal model of the device is developed which is very accurate in the range of temperature from about -50°C to +120°C and subsequently, the SSECPs (Small Signal Equivalent Circuit Parameters) expressions are determined in the previous polynomial form. The approach to define the new models is based on physical considerations concerning the thermal effects, necessary to achieve a reliable design, in spite of their non-physical nature
Keywords :
III-V semiconductors; MESFET integrated circuits; Schottky gate field effect transistors; circuit layout CAD; circuit optimisation; field effect MMIC; gallium arsenide; integrated circuit layout; integrated circuit modelling; semiconductor device models; thermal analysis; -50 to 120 C; CAD; GaAs; GaAs MESFETs; automatic procedure; large signal thermal models; low-frequency design techniques; low-power GaAs ICs; low-power MMICs; optimal layout; polynomial form; small signal equivalent circuit parameters; small signal thermal models; temperature range; thermal design rules; thermal effect optimization; Design automation; Design optimization; FETs; Foundries; Frequency; Gallium arsenide; MMICs; Polynomials; Signal design; Temperature distribution;
Conference_Titel :
Analog and Mixed IC Design, 1997. Proceedings., 1997 2nd IEEE-CAS Region 8 Workshop on
Conference_Location :
Baveno
Print_ISBN :
0-7803-4240-2
DOI :
10.1109/AMICD.1997.637204