• DocumentCode
    2408182
  • Title

    SSC-a tool for the synthesis of testable sequential machines

  • Author

    Makki, R.Z. ; Muha, J. ; Boughazal, S. ; Kaylani, T.

  • Author_Institution
    North Carolina Univ., Charlotte, NC, USA
  • fYear
    1990
  • fDate
    Feb. 26 1990-March 2 1990
  • Firstpage
    455
  • Lastpage
    461
  • Abstract
    A new CAD system, called SSC, is presented for the design and test of finite-state machines (FSMs). SSC utilizes a controlled design environment to simplify the logic synthesis and verification process. SSC utilizes a high-level structured input description where the state sequencing information is implicit in the specification. It is demonstrated that synthesis for testability and test generation depend on the type of state assignment adopted. SSC offers flexibility of choice in the synthesis of FSMs. It is shown that this flexibility is important because each of the state assignment options in SSC is tailored for a specific FSM structure. This enhances the performance of the final product as measured by silicon area, speed, and testability.<>
  • Keywords
    finite automata; logic CAD; logic testing; CAD system; SSC; finite-state machines; state assignment; test generation; testability; testable sequential machines; Automata; Automatic test pattern generation; Circuit faults; Control systems; Design for testability; Encoding; Minimization; Sequential analysis; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compcon Spring '90. Intellectual Leverage. Digest of Papers. Thirty-Fifth IEEE Computer Society International Conference.
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-8186-2028-5
  • Type

    conf

  • DOI
    10.1109/CMPCON.1990.63723
  • Filename
    63723