DocumentCode
2408182
Title
SSC-a tool for the synthesis of testable sequential machines
Author
Makki, R.Z. ; Muha, J. ; Boughazal, S. ; Kaylani, T.
Author_Institution
North Carolina Univ., Charlotte, NC, USA
fYear
1990
fDate
Feb. 26 1990-March 2 1990
Firstpage
455
Lastpage
461
Abstract
A new CAD system, called SSC, is presented for the design and test of finite-state machines (FSMs). SSC utilizes a controlled design environment to simplify the logic synthesis and verification process. SSC utilizes a high-level structured input description where the state sequencing information is implicit in the specification. It is demonstrated that synthesis for testability and test generation depend on the type of state assignment adopted. SSC offers flexibility of choice in the synthesis of FSMs. It is shown that this flexibility is important because each of the state assignment options in SSC is tailored for a specific FSM structure. This enhances the performance of the final product as measured by silicon area, speed, and testability.<>
Keywords
finite automata; logic CAD; logic testing; CAD system; SSC; finite-state machines; state assignment; test generation; testability; testable sequential machines; Automata; Automatic test pattern generation; Circuit faults; Control systems; Design for testability; Encoding; Minimization; Sequential analysis; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Compcon Spring '90. Intellectual Leverage. Digest of Papers. Thirty-Fifth IEEE Computer Society International Conference.
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-8186-2028-5
Type
conf
DOI
10.1109/CMPCON.1990.63723
Filename
63723
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