DocumentCode :
2409895
Title :
Assessment of quality control parameters for an X-ray tube using the monte carlo method and unfolding techniques
Author :
Gallardo, Sergio ; Ródenas, José ; Verdú, Gumersindo ; Querol, Andrea
Author_Institution :
Chem. & Nucl. Eng. Dept., Polytech. Univ. of Valencia, Valencia, Spain
fYear :
2009
fDate :
3-6 Sept. 2009
Firstpage :
1367
Lastpage :
1370
Abstract :
Quality Control (QC) parameters for an X-ray tube such as Half Value Layer (HVL), homogeneity factor and mean photon energy, can be obtained from the primary beam spectrum. A direct Monte Carlo (MC) simulation has been used to obtain this spectrum. Indirect spectrometry procedures such as Compton scattering have been also experimentally utilized since direct spectrometry causes a pile-up effect in detectors. As well the Compton spectrometry has been simulated with the MC method. In both cases unfolding techniques shall be applied to obtain the primary spectrum. Two unfolding methods (TSVD and Spectro-X) have been analyzed. Results are compared each other and with reference values taken from IPEM Report 78 catalogue. Direct MC simulation is a good approximation to obtain the primary spectrum and hence the QC parameters. TSVD is a better unfolding method for the scattered spectrum than the Spectro-X code. An improvement of the methodology to obtain QC parameters is important in Biomedical Engineering (BME) applications due to the wide use of X-ray tubes.
Keywords :
Compton effect; Monte Carlo methods; X-ray tubes; biology computing; biomedical engineering; quality control; Compton scattering; Half Value Layer; IPEM Report 78 catalogue; Monte Carlo simulation; Spectro-X code; X-ray tube; biomedical engineering; mean photon energy; quality control assessment; unfolding techniques; Biomedical Engineering; Computer Simulation; Humans; Models, Statistical; Monte Carlo Method; Photons; Quality Control; Radiography; Scattering, Radiation; X-Rays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location :
Minneapolis, MN
ISSN :
1557-170X
Print_ISBN :
978-1-4244-3296-7
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2009.5334451
Filename :
5334451
Link To Document :
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