Title :
Single event effects testing of a PLL and LVDS in a RadHard-by-design 0.25-micron ASIC
Author :
Hartwell, Mary ; Hafer, Craig ; Milliken, Peter ; Farris, Teresa
Author_Institution :
Aeroflex Colorado Springs Inc., Colorado Springs, CO, USA
Abstract :
SEE testing performed on PLL and LVDS circuits showed both are immune to SEL to a LET of 108 MeV-cm2/mg. Temporary phase shifts and frequency changes caused by SET in the PLL are investigated.
Keywords :
CMOS integrated circuits; application specific integrated circuits; driver circuits; integrated circuit testing; low-power electronics; phase locked loops; radiation effects; 0.25 micron; ASIC RadHard-by-design; LVDS circuits; PLL circuits; frequency change; low voltage differential signal drivers; phase locked loops; phase shifts; single event effects testing; single event latch up; Application specific integrated circuits; Circuit testing; Integrated circuit technology; Libraries; Performance evaluation; Phase locked loops; Radiation hardening; Space technology; Springs; Technology management;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532673
