Title :
Recent total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA
Author :
Cochran, Donna J. ; Kniffin, Scott D. ; Ladbury, Raymond L. ; O´Bryan, Martha V. ; Poivey, Christian F. ; Kim, Hak ; Irwin, Tim L. ; Phan, Anthony M. ; Carts, Martin A. ; Forney, James D. ; LaBel, Kenneth A. ; Reed, Robert A. ; Sanders, Anthony B. ; Hawki
Author_Institution :
Muniz Eng. Inc., NASA-GSFC, Greenbelt, MD, USA
Abstract :
We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include optoelectronics, digital, analog, linear bipolar devices, hybrid devices, analog-to-digital converters (ADCs), and digital-to-analog converters (DACs), among others.
Keywords :
circuit testing; electron device testing; radiation effects; space vehicle electronics; analog devices; analog-to-digital converters; digital devices; digital-to-analog converters; displacement damage; hybrid devices; linear bipolar devices; optoelectronic devices; spacecraft electronics; total ionizing dose; Aerospace electronics; Analog-digital conversion; Degradation; Electronic equipment testing; NASA; Performance evaluation; Protons; Space vehicles; Test facilities; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532682
