• DocumentCode
    2411035
  • Title

    Compendia of radiation test results of integrated circuits

  • Author

    Layton, Phil ; Patnaude, Ed ; Williamson, Gale ; Longden, Larry ; Sloan, Clancy

  • Author_Institution
    Maxwell Technol. Inc., San Diego, CA, USA
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    156
  • Lastpage
    162
  • Abstract
    Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
  • Keywords
    integrated circuit testing; radiation effects; integrated circuit testing; radiation effects; radiation reliability data; radiation testing; single event effects; space environment; space products; total ionizing dose; Circuit testing; Cyclotrons; EPROM; Gold; Integrated circuit testing; Ionizing radiation; Logic; Performance evaluation; Single event upset; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532683
  • Filename
    1532683
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2411035