Title :
Test generation for the distributed test architecture
Author :
Luo, Gang ; Dssouli, Rachida ; Bochmann, Gregor V. ; Venkataram, Pallapa ; Ghedamsi, Abderrazak
Author_Institution :
Dept. d´´IRO, Montreal Univ., Que., Canada
Abstract :
ISO (International Standardization Organization) developed the ISO distributed test architecture for testing layered protocols. Furthermore, a general distributed test architecture where the IUT (implementation under test) contains several distributed ports is used for testing distributed systems, based on the Open Distributing Processing (ODP) Basic Reference Model (BRM). In this architecture, the testers cannot communicate or synchronize with one another unless they communicate through the IUT; and no global clock is available in the system. This architecture could model a test architecture of a communication network with n accessing nodes, where the testers reside in these nodes. When n=2, this general distributed test architecture reduces to the ISO distributed test architecture. The authors develop a test selection method with respect to this general distributed test architecture
Keywords :
ISO standards; protocols; telecommunication equipment testing; test equipment; communication network; distributed ports; general distributed test architecture; layered protocols; test selection; Communication networks; Communication system control; Computer architecture; Control systems; Decision support systems; Distributed power generation; Protocols; Standardization; Synchronization; System testing;
Conference_Titel :
Networks, 1993. International Conference on Information Engineering '93. 'Communications and Networks for the Year 2000', Proceedings of IEEE Singapore International Conference on
Print_ISBN :
0-7803-1445-X
DOI :
10.1109/SICON.1993.515672