DocumentCode :
2412502
Title :
A custom-cell identification method for high-performance mixed standard/custom-cell designs
Author :
Lo, Jennifer Y -L ; Kuo, Wu-An ; Wu, Allen C -H ; Hwang, Ting Ting
Author_Institution :
Comput. Sci. Dept., Tsing Hua Univ., Hsin-Chu, Taiwan
fYear :
2003
fDate :
2003
Firstpage :
1102
Lastpage :
1103
Abstract :
This paper describes a design method targeted to mixed standard- and custom-cells which is carried out as follows. First, it generates a standard-cell design to obtain a maximal achievable speed. Second, it performs a cell customization process to determine which standard cells need to be customized in order to satisfy the given timing constraint. Once designers select a set of standard cells to be customized, they define the specification of the custom cells and develop the cells accordingly. Finally, the designers replace the standard cells with the custom ones and re-evaluate the speed of the design. The customization process continues until the timing constraint is satisfied. In this paper, we present a custom-cell identification method for high-speed datapath-oriented designs. The proposed method uses an HDL-based standard-cell design flow by integrating a custom-cell identification algorithm to determine a minimal-cost cell set and the design budgets for cell customization. Experimental results on a set of benchmarking designs are reported to demonstrate the effectiveness of the proposed method.
Keywords :
hardware description languages; integrated circuit design; logic design; HDL; cell customization design budgets; cell customization process; custom-cell identification method; high-performance mixed standard/custom-cell designs; high-speed datapath-oriented designs; maximal achievable speed standard cell design; minimal-cost cell set; timing constraints; Algorithm design and analysis; Circuit synthesis; Costs; Delay; Design methodology; Libraries; Logic design; Process design; Standards development; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253754
Filename :
1253754
Link To Document :
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