DocumentCode
2413014
Title
Non-intrusive concurrent error detection in FSMs through state/output compaction and monitoring via parity trees
Author
Drineas, Petros ; Makris, Yiorgos
Author_Institution
Departments of CS & EE, Yale Univ., New Haven, CT, USA
fYear
2003
fDate
2003
Firstpage
1164
Lastpage
1165
Abstract
We discuss a non-intrusive methodology for concurrent error detection in FSMs. The proposed method is based on compaction and monitoring of the state/output bits of an FSM via parity trees. While errors may affect more than one state/output bit, not all combinations of state/output bits constitute potential erroneous cases for a given fault model. Therefore, it is possible to compact them without loss of error information. Thus, concurrent error detection is performed through hardware that predicts the values of the compacted state/output bits and compares them to the actual values of the FSM. In order to minimize the incurred hardware overhead, a randomized algorithm is proposed for selecting the minimum number of required parity functions.
Keywords
condition monitoring; error detection; finite state machines; FSM; nonintrusive concurrent error detection; parity functions; parity trees; randomized algorithm; state/output bits compaction; state/output bits monitoring; Circuit faults; Clocks; Compaction; Delay; Electrical fault detection; Fault detection; Hardware; Linear programming; Logic; Monitoring;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN
1530-1591
Print_ISBN
0-7695-1870-2
Type
conf
DOI
10.1109/DATE.2003.1253783
Filename
1253783
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