• DocumentCode
    2413014
  • Title

    Non-intrusive concurrent error detection in FSMs through state/output compaction and monitoring via parity trees

  • Author

    Drineas, Petros ; Makris, Yiorgos

  • Author_Institution
    Departments of CS & EE, Yale Univ., New Haven, CT, USA
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    1164
  • Lastpage
    1165
  • Abstract
    We discuss a non-intrusive methodology for concurrent error detection in FSMs. The proposed method is based on compaction and monitoring of the state/output bits of an FSM via parity trees. While errors may affect more than one state/output bit, not all combinations of state/output bits constitute potential erroneous cases for a given fault model. Therefore, it is possible to compact them without loss of error information. Thus, concurrent error detection is performed through hardware that predicts the values of the compacted state/output bits and compares them to the actual values of the FSM. In order to minimize the incurred hardware overhead, a randomized algorithm is proposed for selecting the minimum number of required parity functions.
  • Keywords
    condition monitoring; error detection; finite state machines; FSM; nonintrusive concurrent error detection; parity functions; parity trees; randomized algorithm; state/output bits compaction; state/output bits monitoring; Circuit faults; Clocks; Compaction; Delay; Electrical fault detection; Fault detection; Hardware; Linear programming; Logic; Monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253783
  • Filename
    1253783