DocumentCode :
2413074
Title :
3D Capacitive Interconnections for High Speed Interchip Communication
Author :
Canegallo, Roberto ; Fazzi, Alberto ; Ciccarelli, Luca ; Magagni, Luca ; Natali, Federico ; Rolandi, Pierluigi ; Jung, Erik ; Di Cioccio, Lea ; Guerrieri, Roberto
Author_Institution :
STMicroelectron., Agrate Brianza
fYear :
2007
fDate :
16-19 Sept. 2007
Firstpage :
1
Lastpage :
8
Abstract :
A 3D interconnection scheme based on capacitive coupling for high speed chip to chip communication has been implemented in a 0.13 mum CMOS process. This paper provides detailed design example for both synchronous and asynchronous transmitter and receiver circuits. The first approach shows with electrodes 15 times 15 mum2 a wide range of operating frequency up to 900 MHz with an energy consumption of 41fJ/bit. In the asynchronous scheme we demonstrate with electrodes 8 times 8 mum2 a vertical propagation of clock at 1.7 GHz and a propagation delay of 420 ps for general purpose signal with energy consumption of 80 f J/bit. Functionality and performance have been demonstrated by using both die-level and wafer-level assembly flows and BER measurements show the reliability of these AC interconnections with no error on more than 1013 bits transmitted.
Keywords :
CMOS integrated circuits; error statistics; integrated circuit interconnections; integrated circuit reliability; 3D capacitive interconnections; AC interconnections reliability; BER measurements; CMOS process; asynchronous receiver circuits; asynchronous transmitter circuits; capacitive coupling; frequency 1.7 GHz; frequency 900 MHz; high speed chip-to-chip communication; high speed interchip communication; size 0.13 mum; synchronous receiver circuits; synchronous transmitter circuits; wafer-level assembly flows; Assembly; CMOS process; Clocks; Coupling circuits; Electrodes; Energy consumption; Frequency; Integrated circuit interconnections; Propagation delay; Transmitters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
Type :
conf
DOI :
10.1109/CICC.2007.4405670
Filename :
4405670
Link To Document :
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