Title :
Analysis of Data Remanence in a 90nm FPGA
Author :
Tuan, Tim ; Strader, Tom ; Trimberger, Steve
Author_Institution :
Xilinx, San Jose
Abstract :
FPGAs are increasingly used in military applications, the security of a design when the part is powered off is an important property that needs to be analyzed. In this paper, we study data remanence in modern FPGAs using a custom 90nm FPGA designed for this test. The effects of temperatures, architecture, memory topology, and power off methods are analyzed. We find that different memory cells in the FPGA architecture have different remanence properties depending on their circuit design, data content, leakage and supply noise. To our knowledge, this is the first study of data remanence in FPGAs and in deep-submicron ICs.
Keywords :
field programmable gate arrays; logic design; FPGA design; data content; data remanence; deep-submicron IC; design security; memory cells; memory topology; military applications; power off method; size 90 nm; supply noise; Circuit noise; Circuit synthesis; Circuit testing; Circuit topology; Data analysis; Data security; Field programmable gate arrays; Memory architecture; Remanence; Temperature;
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
DOI :
10.1109/CICC.2007.4405689
