DocumentCode :
2417281
Title :
An MFC based multi-threaded test environment for the validation of an embedded automotive microcontroller
Author :
Khwaja, Amir A.
fYear :
2000
fDate :
2000
Firstpage :
15
Lastpage :
24
Abstract :
Embedded microcontrollers are used in a multitude of commercial applications such as modems, motor-control systems, air conditioner control systems, automotive engine and antilock braking systems among others. The high processing speed and enhanced peripheral set of these microcontrollers make them suitable for such high-speed event based applications. However, these critical application domains also require that these microcontrollers are highly reliable. The high reliability and low market risks can be ensured by a robust testing process and a proper tools environment for the validation of these microcontrollers both at the component and at the system level. Intel(R)´s Chandler Platform Engineering department developed an object oriented multi-threaded test environment for the validation of its 8XC196EA automotive microcontrollers. The goals of this environment was not only to provide a robust testing environment for the 8XC196EA automotive microcontrollers, but to develop an environment which can be easily extended and reused for the validation of several other future embedded microcontrollers. The environment was developed in conjunction with Microsoft(R) Foundation Classes (MFC). The paper describes the design and mechanism of this test environment, its interactions with various hardware/software environmental components, and the pros and cons of using MFC
Keywords :
automobiles; control system analysis computing; embedded systems; integrated circuit testing; microcontrollers; multi-threading; object-oriented programming; 8XC196EA automotive microcontrollers; MFC based multi-threaded test environment; Microsoft Foundation Classes; commercial applications; critical application domains; embedded automotive microcontroller validation; hardware/software environmental components; high-speed event based applications; market risks; object oriented multi-threaded test environment; peripheral set; processing speed; reliability; robust testing environment; robust testing process; tools environment; Automotive engineering; Control systems; Engines; Hardware; Microcontrollers; Modems; Reliability engineering; Robustness; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Technology of Object-Oriented Languages and Systems, 2000. TOOLS 34. Proceedings. 34th International Conference on
Conference_Location :
Santa Barbara, CA
ISSN :
1530-2067
Print_ISBN :
0-7695-0774-3
Type :
conf
DOI :
10.1109/TOOLS.2000.868955
Filename :
868955
Link To Document :
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